San Jose CA - September 6, 2007 -- Olympus Integrated Technologies America (Olympus-ITA), a subsidiary of Olympus Corporation of Japan and a leader in advanced inspection and defect review systems, has completed the sale of its Model AL3300 Wafer Inspection and Defect Review System to a 300mm integrated device manufacturer (IDM) in the United States. The system will provide optical inspection and defect review for top, edge, and back side inspection of 300mm wafers.

"The AL3300 is a versatile inspection and review station with a set of options that makes it a valuable tool in all areas of the fabrication process" said Greg Baker, president of Olympus Integrated Technologies America. "We anticipate that additional systems will be purchased by this IDM in the near future."

The AL3300 provides a throughput up to 180 wafers per hour in a small, flexible configuration footprint that can be configured to match any factory floor layout. Macro observation and image capture are available for wafer front and back sides under various illumination wavelengths to see various macro defects such as bad coat, hot spots, scratches and contamination. An optional bevel inspection unit allows the unique ability to observe and image the bevel from any angle.

Visit the Olympus booth at SEMICON Taiwan, Booth #849.

About Olympus-Integrated Technologies America
Olympus Integrated Technologies, Inc. (ITA) was founded in March 2000 as a wholly owned subsidiary of Olympus Corporation, Tokyo, Japan. Specializing in semiconductor products and systems for wafer inspection and defect review, ITA is the application software development R&D center for Olympus semiconductor products. Its location in San Jose, California, enables the company to respond quickly to provide sales, service, and support to semiconductor companies throughout the United States. For more information contact Greg Baker at 408-514-3918, email gbaker@olympus-ita.com, or visit our website at www.olympus-ita.com.